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Three-Dimensional Light Refractive Index and Film Thickness Measurement Device Prism Coupler SPA-3DR

Measure the light refractive index of the sample along the X-axis, Y-axis, and Z-axis while rotating! For 3D birefringence measurement of FPD films and SiO2, etc.

Sairon Technology, Inc. 3D Optical Refractive Index and Film Thickness Measurement Device Prism Coupler SPA-3DR measures the optical refractive index along the X, Y, and Z axes of the sample while rotating. The measurement targets include transparent films, thin films on transparent films, quartz, liquids, etc., making it suitable for applications such as 3D birefringence measurement of FPD films, SiO2, and more. The built-in laser operates in the range of 405nm to 1550nm and can accommodate up to four types. Birefringence measurement is performed by rotating between the X and Y axes with an accuracy of 0.05° and measuring at any position. Additionally, for multilayer thin films, it is also possible to simultaneously measure the optical refractive index and film thickness of two layers individually without any assumptions. For more details, please contact us or refer to the catalog.

  • Coating thickness gauge
  • prism
  • Other measurement, recording and measuring instruments
  • Prism Coupler

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Optical waveguide/CPO propagation loss measurement device/loss measurement device prism coupler

Next-generation device CPO applicable for optical waveguide loss measurement.

In addition to being used solely as a three-dimensional light refractive index and film thickness measurement device, it can also perform next-generation device CPO optical waveguide loss measurement. Based on the matching oil method, it allows for high-precision evaluation. Of course, it is suitable for general transparent films, thin films on transparent films, quartz, liquids, and applications such as three-dimensional birefringence measurement of FPD films and SiO2. The installed lasers can range from 405nm to 1550nm, with up to four types available. Birefringence measurement is conducted by rotating between the X and Y axes with an accuracy of 0.05° and measuring at any position. Additionally, for multilayer thin films, it is possible to simultaneously measure the optical refractive index and film thickness of two layers individually without any assumptions.

  • Testing Equipment and Devices
  • Prism Coupler

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